Analytic SEM – JEOL 7500F Equipment, Metrology Magnification 25x to 1,000,000,000x 1.0-nm at 15 keV Resolution Accelerating Voltage 0.1 V to 30 keV Variable Tilt and Working Distance Wafer Handling Pieces to 6” Skills Posted on March 14, 2019 ← Profilometer – Vecco Dektak 150 Semiconductor FTIR – Nicolet ECO 1000s →
Recent Comments