by kbair | Mar 14, 2019 |
Reflectance and Transmission Modes
by kbair | Mar 14, 2019 |
Magnification 25x to 1,000,000,000x 1.0-nm at 15 keV Resolution Accelerating Voltage 0.1 V to 30 keV Variable Tilt and Working Distance Wafer Handling Pieces to 6”
by kbair | Mar 14, 2019 |
0.1-nm Vertical Resolution 3-D Mapping Capability
by kbair | Mar 14, 2019 |
Fully Automated Wafer Mapping and CD measurement Simple to Operate Low Voltage Operation Minimizes Charging
by kbair | Mar 14, 2019 |
Atomic Resolution Full Range of Standard SPM Modes
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