Semiconductor FTIR – Nicolet ECO 1000s

by kbair | Mar 14, 2019 | 0 comments

Reflectance and Transmission Modes

Analytic SEM – JEOL 7500F

by kbair | Mar 14, 2019 | 0 comments

Magnification 25x to 1,000,000,000x 1.0-nm at 15 keV Resolution Accelerating Voltage 0.1 V to 30 keV Variable Tilt and Working Distance Wafer Handling Pieces to 6”

Profilometer – Vecco Dektak 150

by kbair | Mar 14, 2019 | 0 comments

0.1-nm Vertical Resolution 3-D Mapping Capability

Critical Dimension SEM – AMAT 7830i

by kbair | Mar 14, 2019 | 0 comments

Fully Automated Wafer Mapping and CD measurement Simple to Operate Low Voltage Operation Minimizes Charging

AFM – Bruker Innova

by kbair | Mar 14, 2019 | 0 comments

Atomic Resolution Full Range of Standard SPM Modes